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      Sangyeop-kim

      데이터 광부

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Paper-review

  • Attention based dropout layer for weakly supervised object localization

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  • Grad-CAM: Why did you say that? Visual Explanations from Deep Networks via Gradient-based Localization

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  • Learning Deep Features for Discriminative Localization

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  • Big Data Analytics for Smart Manufacturing: Case Studies in Semiconductor Manufacturing

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  • Fault Detection and Diagnosis Using Self-Attentive Convolutional Neural Networks for Variable-Length Sensor Data in Semiconductor Manufacturing

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  • You Only Look Once: Unified, Real-Time Object Detection

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  • CBAM: Convolutional Block Attention Module

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  • Fast R-CNN

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  • Isolation Forest

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